Testing apparatus
AssigneeAdvantest Corporation
InventorMakoto Shinohara
Life of this patent
Estimating the term…
Abstract
To provide a testing apparatus having a function of testing a D/A converter and so forth with a reduced testing time. The testing apparatus tests a converter having functionality of converting an input signal and outputting the signal thus converted. The testing apparatus comprises: a pattern generator which generates an input signal having a predetermined cycle; a clock generator which generates a measurement clock having a predetermined cycle; a measurement unit which receives the measurement clock, and sequentially measures the values of the output signal, synchronously with the measurement clock; and a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by the measurement unit.
Claims4
A testing apparatus which tests a converter having functionality of converting an input signal and outputting the signal thus converted, said testing apparatus comprising:
- a clock generator which generates a measurement clock having a predetermined cycle;
- a pattern generator which generates said input signal having approximately the same cycle as that of said measurement clock;
- a measurement unit which receives said measurement clock, and sequentially measures the values of said output signal, synchronously with said measurement clock;
- and
- a storage unit which stores, at different corresponding addresses, the values thus sequentially measured by said measurement unit.
Dependencies are inferred from the claim text.