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US 2006/0214677 A1Published application
Probe for combined signals
AssigneeCascade Microtech, Inc.
InventorsLeonard Hayden, Scott Rumbaugh, Mike Andrews
Life of this patent
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Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
Claims3
A probing system for interconnecting a source of a modulated signal and a source of a direct current to a terminal of a device under test having a device impedance, said probing system comprising:
- (a) a capacitor;
- (b) a resistor connected in series with said capacitor, said resistor and said capacitor interconnecting said source of said modulated signal and said terminal of said device under test;
- and
- (c) an inductor interconnecting said source of direct current and said terminal of said device under test.
1 more element
Dependencies are inferred from the claim text.