US 2006/0214112 A1 · Method and kit for calibrating a photoluminescence measurement

Abstract

The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(λ), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(λ) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm−1. According to the method of the invention, partial correction functions Fi(λ) are generated by forming the quotient of the measured fluorescence spectra Ji(λ) and the corresponding corrected fluorescence spectra Ii(λ), which are then combined to form a total correction function F(λ) for a broad spectral range. The combination factors αi are hereby computed by statistical averaging of consecutive partial correction functions Fi(λ) over only a predefined, limited overlap region λi/i+1±ΔλOL about the mutual crossover wavelength λi/i+1.

Claims60

Dependent claims

A method for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system, with the steps of

(a) measuring fluorescence spectra (Ji(λ)) of a plurality of fluorescence standards (i) with the photoluminescence measurement system to be calibrated, wherein the fluorescence standards (i) are selected, so that their combined spectrally corrected and normalized fluorescence spectra (Ii(λ)) cover a predefined spectral range in such a way, that the fluorescence bands of the corrected, sequentially arranged fluorescence spectra (Ii(λ)) have at least a minimum predefined intensity at their crossover wavelengths (λi/i+1);
(b) calculating combination factors (αi) through statistical averaging of consecutive partial correction functions (Fi(λ)), wherein the partial correction functions (Fi(λ)) are formed by forming the quotient of the measured fluorescence spectra (Ji(λ)) and the corresponding corrected fluorescence spectra (Ii(λ)) of the fluorescence standards (i), and wherein the statistical averaging takes place over a predefined, limited overlap region (λi/i+1±ΔλOL) about the mutual crossover wavelengths (λi/i+1);
and
(c) determining a total correction function (F(λ)), for the predefined spectral range by combination of the partial correction functions (Fi(λ)), which are weighted according to the combination factors (αi).

1 more element

A kit for traceable calibration of a photoluminescence measurement system, in particular a fluorescence measurement system, comprising

(a) a plurality of fluorescence standards (i), and
(b) corrected fluorescence spectra (Ii(λ)) of the fluorescence standards (i) in computer-readable form and/or a reference to an Internet page, from which the corrected fluorescence spectra (Ii(λ)) can be downloaded, wherein the fluorescence standards (i) are selected so that their combined spectrally corrected fluorescence spectra (Ii(λ)) cover a predefined spectral range in such a way, that fluorescence bands of the corrected, consecutive fluorescence spectra (Ii(λ)) have in the vis/NIR spectral range with λ≦700 nm a minimal predefined intensity at their overlapping wavelengths (λi/i+1) of at least 20% of the corresponding maximum in-band intensity, their fluorescence bands have each a half-width (FWHM) of at least 1400 cm−1 and an unstructured band curve without a shoulder and with only one respective maximum in the relevant spectral range at a spectral resolution of 1 nm.

Dependencies are inferred from the claim text.

Method and kit for calibrating a photoluminescence measurement

Life of this patent

Method and kit for calibrating a photoluminescence measurement

Life of this patent

Abstract

Claims60