Point scanning laser scanning microscope and methods for adjustment of a microscope

A point scanning Laser Scanning Microscope comprising:

• a probe;
• a detector;
• a pupil plane of a beam path between the probe and the detector for separation of an illumination beam and a detection beam;
• an element arranged in or near the pupil plane, the element including a reflecting or a transmitting first region for the transmission of the illumination beam and a second transmitting or reflecting region, lying essentially outside the first region, for the transmission of light from the probe;
• and
• manipulating means for varying the size and/or the form of the first region and/or second region.

A method for adjusting a microscope, comprising the steps of:

• providing a pupil plane of a beam path between a probe and a detector for separation of an illumination beam and a detection beam;
• arranging an element arranged in or near the pupil plane, the element including a reflecting or a transmitting first region for the transmission of the illumination beam and a second transmitting or reflecting region, lying essentially outside the first region, for the transmission of light from the probe;
• and
• varying the size and/or the form of the first and/or the second region through the use of manipulating devices under the control of a control circuit.