Decoupling capacitance analysis method
AssigneeInternational Business Machines Corporation
InventorsChristopher Berry, Howard Smith, Richard Underwood, Alan Wagstaff
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsChristopher Berry, Howard Smith, Richard Underwood, Alan Wagstaff
Estimating the term…
This method for decoupling capacitance analysis improves upon existing techniques to attempt to give a more accurate representation of the power supply fluctuations on a chip while keeping runtime comparable. This method employs the following techniques; a) a method for descending through hierarchy and dividing the design into a variable sized grid; b) an algorithm to determine which grid locations of a design don't have enough decoupling capacitors for all of the devices in that grid location; c) an algorithm to determine which grid locations are subject to harmful neighboring effects; and d) a method to display the results of the calculations in a graphical manor to allow easy identification of problem areas.
A method of measuring neighboring effects in an integrated chip design comprising the steps of:
Dependencies are inferred from the claim text.