Method for incorporating pattern dependent effects in circuit simulations
AssigneeAltera Corporation
InventorJeffrey Watt
Life of this patent
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Abstract
Methods, software, and apparatus for providing a netlist for simulation that includes one or more parameters that are determined by one or more pattern dependent effects. One particular embodiment of the present invention receives a layout of a circuit including one or more MOSFET transistors. For one or more of the MOSFET transistors, spacing between transistors is measured using the received layout and a pattern dependent parameter is determined. This parameter modifies the length of the gate that is used in simulation. In other embodiments, other pattern dependent effects can be used to determine the values of one or more parameters. These parameters may be used to modify gate length, emitter size, resistor width, or other device characteristics.
Claims23
A method of simulating the expected behavior of an integrated circuit portion comprising:
- receiving a layout of a portion of an integrated circuit including a first device and a second device;
- measuring a first distance between the first device and the second device;
- calculating a parameter using the first distance;
- and
- extracting a netlist including the parameter.
A method of simulating the expected behavior of an integrated circuit portion comprising:
- receiving a netlist of a portion of an integrated circuit including a first device and a second device;
- receiving a layout of a portion of an integrated circuit including the first device and the second device;
- measuring a first distance between the first device and the second device on the received layout;
- calculating a parameter using the first distance;
- and
- modifying the netlist by including the parameter.
A computer system including:
- code for receiving a layout of an integrated circuit portion including a plurality of devices;
- a first database for storing the layout;
- code for measuring distances between devices on the layout;
- code for calculating parameters using measured distances;
- and
- code for extracting a netlist from the layout, the netlist including the calculated parameters.
Dependencies are inferred from the claim text.