Electronic element comprising an electronic circuit which is to be tested and test system arrangement which is used to test the electronic element

A test system comprising:

• an electronic element containing:
• an electronic circuit to be tested which has input terminals to receive a test signal sequence to test the electronic circuit, and output terminals, actual value signals of the electronic circuit to be tested provided at the output terminals in response to the test signal sequence, the electronic element set up to process signals of a 3-value logic, and
• a comparator circuit having first and second input terminals and an output terminal, each of the output terminals of the electronic circuit to be tested coupled to a first input terminal, the second input terminals to receive desired value signals, and the comparator circuit to compare the actual value signals with the desired value signals and provide the comparison to the output terminal of the comparator circuit,
• a vector memory;
• first output terminals coupled to the input terminals of the electronic circuit;
• second output terminals coupled to second input terminals of the comparator circuit;
• and
• an input terminal for each of the output terminals of the comparator circuit, an input terminal being provided which is coupled to the corresponding output terminal of the comparator circuit.

A method of testing an electronic circuit, the method comprising:

• receiving a test signal sequence to test the electronic circuit;
• providing actual value signals of a 3-value logic of the electronic circuit in response to the test signal sequence;
• receiving desired value signals of the 3-value logic;
• comparing the actual value signals with the desired value signals;
• and
• providing the comparison to an output terminal.

A method of testing an electronic circuit, the method comprising:

• receiving a test signal sequence to test the electronic circuit;
• storing actual value signals of a 3-value logic of the electronic circuit in response to the test signal sequence and desired value signals of the 3-value logic;
• comparing the actual value signals with the desired value signals;
• and
• providing the comparison to an output terminal.

An electronic element comprising:

• means for receiving a test signal sequence to test the electronic circuit;
• means for providing actual value signals of a 3-value logic of the electronic circuit in response to the test signal sequence;
• means for receiving desired value signals of the 3-value logic;
• means for comparing the actual value signals with the desired value signals;
• and
• means for providing the comparison.