Method for normalization of an eye diagram and selection of sampling parameters for a receiver
AssigneeAgilent Technologies, Inc.
InventorRichard Nygaard
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorRichard Nygaard
Estimating the term…
Measurements for an eye diagram of a signal of interest are placed in a data structure that is examined to locate an eye opening of interest. The eye opening of interest has already been, or is subsequently, normalized into figure of merit units related to the operational voltage and timing requirements of the data receiver for that signal. The locations within the normalized eye opening may be taken as center locations for trial symmetric shapes that start out small and are enlarged until they first include locations not part of the normalized eye opening. The center of a largest such shape is mapped back into the units of the original eye diagram as optimum sampling parameters for data analysis equipment that uses the receiver to sample the signal once per unit interval to discover logical value. An alternative is to repeatedly remove the ‘outer layer’ of the normalized eye opening until only one location remains.
A method of normalizing eye diagram data for a work signal to reflect the performance characteristics of a data receiver to which the work signal is to be applied, the method comprising the steps of:
A method of selecting sample parameters for the measurement of a digital work signal to be applied to a data receiver, the method comprising the steps of:
A method of locating the center of a largest circular shape that will fit inside an eye opening of an eye diagram for a digital signal, the method comprising the steps of:
Dependencies are inferred from the claim text.