Selective surface exposure, cleans and conditioning of the germanium film in a Ge photodetector
AssigneeIntel Corporation
InventorsJustin Brask, Bruce Block, Uday Shah
Life of this patent
Estimating the term…
Abstract
A method of protecting a sensitive layer from harsh chemistries. The method includes forming a first sensitive layer, forming a second layer upon the first layer, then forming a third layer over the second layer. The third layer is utilized as a mask during patterning of the second layer. During patterning, however, the second layer is only partially etched, thus leaving a buffer layer overlying the first layer. The third layer is completely removed while the buffer layer protects the first layer from the harsh chemicals that are utilized to remove the third layer. Then, the buffer layer is carefully removed down to the surface of the first layer.
Claims11
1-6. (canceled)
A method, comprising:
- forming a germanium layer on a semiconductor substrate;
- the second chemistry is CH2F2/O2/Ar, the third chemistry includes an O2 plasma and a sulfuric acid mixture with an oxidizing agent.
An apparatus, comprising:
- a germanium layer on a substrate, the germanium layer having a surface with primarily the same atomic termin.
Dependencies are inferred from the claim text.