Method for inspecting a region of interest
AssigneeTeradyne, Inc.
InventorRohit Patnaik
Life of this patent
Estimating the term…
Abstract
An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.
Claims2
1-8. (canceled)
A method for inspecting a region of interest, comprising the steps of:
- acquiring data corresponding to a number of horizontal slice images extending through an object of interest;
- and
- locating a best horizontal slice image from the number of horizontal slice images, the locating step comprising:
- computing, for at least two of the horizontal slice images,
- an amount of solder within each of the at least two horizontal slice images;
- and
- reviewing a distribution of the computed amounts of solder.
Dependencies are inferred from the claim text.