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US 2006/0186911 A1Published application
Apparatus and methods for self-heating burn-in processes
AssigneeIntel Corporation
InventorJeffrey Norris
Life of this patent
Estimating the term…
Abstract
A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the DUTs to a self-heating burn-in procedure while the burn-in boards are docked to the docking locations. Other embodiments are described and claimed.
Claims17
1-39. (canceled)
An apparatus comprising:
- a vertical support structure;
- a plurality of docking locations mounted on the support structure, each docking location including:
- a horizontally-extending support member to support a burn-in board;
- a connector adapted to be electrically coupled to the burn-in board;
- a fan positioned above and behind the connector;
- and
- a duct positioned adjacent the fan to direct air from the fan to the burn-in board.
4 more elements
An apparatus comprising:
- a vertical support structure;
- a plurality of horizontally-extending support members mounted on the support structure;
- a plurality of burn-in boards, each support member supporting at least a portion of one of said plurality of burn-in boards;
- a plurality of sockets each positioned below a respective one of the support members on a respective one of the burn-in boards;
- a plurality of fans each mounted on the vertical support structure behind, and on an opposite side of the support structure from, a respective one of the support members, each of the support members being at least partially hollow to form a respective duct to direct air from a respective one of the fans to a respective one of the sockets.
2 more elements
A method comprising:
- applying a burn-in procedure to a device under test (DUT) at a burn-in station;
- and
- controlling a cooling device at the burn-in station in response to a signal output from the DUT.
53-81. (canceled)
A system comprising:
- a support structure;
- a plurality of burn-in stations arrayed on the support structure;
- a plurality of burn-in boards mounted on the support structure, each burn-in board including at least one socket, each socket at a respective one of the burn-in stations, each socket further being adapted to receive a device under test (DUT) to be burned-in at the respective burn-in station;
- a tray adapted to hold DUTs;
- and
- a transporter adapted to transport the DUTs from the tray to the burn-in stations and to install the DUTs in the sockets at the burn-in stations;
- wherein each of the burn-in stations includes a respective fan to selectively cool the respective DUT at said each burn-in station.
4 more elements
Dependencies are inferred from the claim text.