Performance measurement of device dedicated to phase locked loop using second order system approximation
AssigneeInternational Business Machines Corporation
InventorsFaraydon Pakbaz, Stephen Wyatt
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Abstract
A method, system and program product to measure performance of a device dedicated to a phase locked loop (PLL). A resistor-inductor-capacitor (RLC) model is produced to simulate the PLL. The RLC model and the device to be measured are mapped together into a test circuit and the characteristics of the test circuit is analyzed to determine whether the device, if attached to the PLL represented by the RLC model, can meet the required standard of performance. This invention can be used to measure the performance of all kinds of devices attached to all kinds of PLLs.
Claims20
A method of measuring performance of a device dedicated to a phase locked loop, the method comprising the steps of:
- representing the phase locked loop with a second order transfer function;
- generating a resistor-inductor-capacitor (RLC) model based on the second order transfer function;
- coupling the RLC model and the device together to make a test circuit;
- and
- analyzing a characteristic of the test circuit to determine the performance of the device.
A system for measuring performance of a device dedicated to a phase locked loop, the system comprising:
- means for representing the phase locked loop with a second order transfer function;
- means for generating a resistor-inductor-capacitor (RLC) model based on the second order transfer function;
- means for coupling the RLC model and the device together to make a test circuit;
- and
- means for analyzing a characteristic of the test circuit to determine the performance of the device.
A computer program product comprising a computer usable medium having computer readable program code embodied therein for measuring performance of a device dedicated to a phase locked loop, the program product comprising:
- program code configured to represent the phase locked loop with a second order transfer function;
- program code configured to generate a resistor-inductor-capacitor (RLC) model based on the second order transfer function;
- program code configured to design a coupling of the RLC model and the device together to make a test circuit;
- and
- program code configured to analyze a characteristic of the test circuit to determine the performance of the device.
Dependencies are inferred from the claim text.