Semiconductor device, and method for manufacturing the same
AssigneeRohm Co., Ltd.
InventorsYoshiaki Oku, Norikazu Nishiyama, Korekazu Ueyama
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Abstract
The invention is characterized by attaining a lower dielectric constant and including an inorganic dielectric film which is formed on the surface of a substrate and has a cyclic porous structure having a pore ratio of 50% or higher.
Claims13
1-4. (canceled)
The semiconductor device according to claim 43, wherein the inorganic film is a dielectric film formed by repeatedly laminating, on and in parallel with the surface of the substrate, a first porous structure domain layer in which columnar pores are arranged cyclically, and a second porous structure domain in which layered pores are cyclically arranged in parallel with the surface of the substrate.
(canceled)
The semiconductor device according to claim 43, wherein the inorganic film comprises an interlayer dielectric film that comprises a first interlayer dielectric film which is formed on a first layer wiring conductor and has contact holes to contact the first layer wiring conductor, and a second interlayer dielectric film to be charged into an inter-wiring area of a second layer wiring conductor formed on the first interlayer dielectric film;
- and the first interlayer dielectric film is formed from a second porous structure domain in which layered pores are arranged cyclically.
The semiconductor device according to claim 43, wherein the inorganic film comprises an interlayer dielectric film that comprises a first interlayer dielectric film which is formed on the first layer wiring conductor and has contact holes to contact a first layer wiring conductor, and a second interlayer dielectric film to be charged into an inter-wiring area of a second layer wiring conductor formed on the first interlayer dielectric film;
- the first interlayer dielectric film is formed from a second porous structure domain in which layered pores are arranged cyclically;
- and the second interlayer dielectric film is formed from a first porous structure domain in which columnar pores are arranged cyclically.
The semiconductor device according to claim 43, wherein the inorganic film comprises an interlayer dielectric film that comprises a first interlayer dielectric film which is formed on a first layer wiring conductor and has contact holes to contact the first layer wiring conductor, and a second interlayer dielectric film to be charged into an inter-wiring area of a second layer wiring conductor formed on the first interlayer dielectric film;
- the first interlayer dielectric film is formed from a second porous structure domain in which layered pores formed so as to become parallel with the surface of the substrate are arranged cyclically;
- and the second interlayer dielectric film is formed from a third porous structure domain in which layered pores formed so as to become substantially perpendicular to the surface of the substrate are arranged cyclically.
10-15. (canceled)
The semiconductor device according to claim 43, wherein the inorganic film is a dielectric film formed on the surface of the substrate and has a cyclic porous structure including columnar pores oriented so as to become parallel with the surface of the substrate.
The semiconductor device according to claim 43, wherein the inorganic film is a dielectric film formed on the surface of the substrate and includes a plurality of cyclic porous structure domains containing columnar pores oriented in one direction so as to become parallel with the surface of the substrate;
- and adjacent porous structure domains are oriented in different directions.
The semiconductor device according to claim 43, wherein the inorganic film is a dielectric film formed on the surface of the substrate and has a cyclic porous structure domain in which layered pores are oriented cyclically in one direction so as to become parallel with the surface of the substrate.
19-42. (canceled)
A semiconductor device comprising:
- an inorganic film which is formed on the surface of a substrate and has cyclic porous structures of two or more types.
44-46. (canceled)
Dependencies are inferred from the claim text.