Low power magnetoelectronic device structures utilizing enhanced permeability materials
AssigneeFreescale Semiconductor, Inc.
InventorsNicholas Rizzo, Renu Dave, Jon Slaughter, Srinivas Pietambaram
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AssigneeFreescale Semiconductor, Inc.
InventorsNicholas Rizzo, Renu Dave, Jon Slaughter, Srinivas Pietambaram
Estimating the term…
Low power magnetoelectronic device structures and methods for making the same are provided. One magnetoelectronic device structure (100) comprises a programming line (104), a magnetoelectronic device (102) magnetically coupled to the programming line, and an enhanced permeability dielectric material (106) disposed adjacent the magnetoelectronic device. The enhanced permeability dielectric material has a permeability no less than approximately 1.5. A method for making a magnetoelectronic device structure is also provided. The method comprises fabricating a magnetoelectronic device (102) and depositing a conducting line (104). A layer of enhanced permeability dielectric material (106) having a permeability no less than approximately 1.5 is formed, wherein after the step of fabricating a magnetoelectronic device and the step of depositing a conducting line, the layer of enhanced permeability dielectric material is situated adjacent the magnetoelectronic device.
A magnetoelectronic device structure comprising:
A method for making a magnetoelectronic device structure, the method comprising:
A method for fabricating an enhanced permeability dielectric material having a magnetic permeability no less than approximately 1.5 and having a predetermined thickness, the method comprising:
Dependencies are inferred from the claim text.