Device for measuring the reflection factor

Device for measuring the reflection factor comprising:

• at least one light emitting part from which light with a certain wavelength and directional capacity is emitted to irradiate a surface of a measurement area of a microchip which is to be measured with emitted light, and
• at least one light receiving part which receives light reflected from the measurement area for determination of the reflection factor of the measurement area,
• wherein a transparent component is located on the measurement area of the microchip,
• wherein the light emitting part is located directly above the measurement area,
• wherein the surface irradiated by the light emitting part lies within the measurement area, and
• wherein the light receiving part is located in an angular region θ (in °) which is located between angles θmin and θmax, θmin and θmax (in °) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein θmin is 1/2α and θmax corresponds to sin-1(1/n), where α (°) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component, and in which the relationship (1/2)α≦θ≦ sin-1(1/n) is satisfied.