Testing of electronic circuits
AssigneeKoninklijke Philips Electronics N.V.
InventorRodger Schuttert
Life of this patent
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Abstract
A plurality of integrated circuits that are used in an electronic circuit have functional interconnections and dedicated test connections. The integrated circuits receive and transmit synchronization information, such as clock signals from one integrated circuit to another successively through the chain. This permits a high-test speed. Preferably the synchronization information is serialized with test data, test results and/or commands. Preferably, the bit rate between successive integrated circuits in the chain is programmable by means of commands transmitted through the chain. Thus, different bit rates may be at different locations along the chain to reduce the delay occurred by the synchronization signals along the chain.
Claims27
An electronic circuit comprising:
- a plurality of integrated circuits each comprising a test control circuit, switchable between a test mode and a normal operating mode;
- functional connections between the integrated circuits;
- test communication connections in addition to the functional connections and forming a chain that includes the integrated circuits, the integrated circuits being arranged to receive and transmit, from one integrated circuit to another successively through the chain, test data, test results and/or commands together with synchronization information, for timing output of the test data to the functional connections and capture of the test results from the functional connections.
An integrated circuit, comprising:
- a test control circuit, switchable between a test mode and a normal operating mode;
- functional connections for connecting to external circuits;
- a test input and a test output in addition to the functional connections, the integrated circuit being arranged to receive test data, test results and/or commands together with synchronization information at the test input, for timing output of the test data to the functional connections and capture of the test results from the functional connections, and to transmit test data, test results and/or commands together with synchronization information at the test output.
A method of testing an electronic circuit that comprises a plurality of integrated circuits, interconnected by functional connections, the method comprising:
- providing test connections in addition to the functional connections, the test connections connecting the integrated circuits in a chain of successive integrated circuits;
- communicating from one integrated circuit to another successively through the chain, test data, test results and/or commands together with synchronization information,
- timing output of the test data to the functional connections and capture of the test results from the functional connections in each integrated circuit with the synchronization information received through the chain.
Dependencies are inferred from the claim text.