Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system
AssigneeSamsung Electronics Co., Ltd.
InventorSeong-Ho Yoon
Life of this patent
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Abstract
An analog base-band (ABB) chipset of a mobile communication system comprises a memory configured to store a test pattern, a test control unit configured to generate a control signal during a test mode, an ABB unit configured to perform a test operation by receiving the test pattern from the memory in response to the test control signal and to output data of the test pattern to the memory in response to the test control signal, and a path selection circuit configured to form a flow path of the test pattern in the ABB unit in response to the test control signal.
Claims20
An analog base-band (ABB) chipset in a mobile communication system, comprising:
- a memory configured to store a test pattern and test data;
- a test control unit configured to generate a test control signal during a test mode;
- an ABB unit configured to perform a test operation by receiving the test pattern from the memory and to output test data to the memory;
- and
- a path selection circuit configured to form a flow path for the test pattern in the ABB unit
An analog base-band (ABB) chipset in a mobile communication system, comprising:
- a memory to store a test pattern and test data;
- a test control unit to generate a test control signal during a test mode;
- an ABB unit to perform a function of converting and filtering intermediate frequency signals and base-band signals and to perform a test operation by receiving a test pattern from the memory and to output test data to the memory;
- and
- a path selection circuit to form a flow path for the test pattern in the ABB unit.
An analog base-band (ABB) chipset in a mobile communication system, comprising:
- a memory to store a test pattern and test data;
- a test control unit to generate a test control signal during a test mode;
- an ABB unit to perform a function of converting and filtering intermediate frequency signals and base-band signals and to perform a test operation by receiving the test pattern from the memory and to output test data to the memory;
- and
- a path selection circuit to form a flow path for the test pattern in the ABB unit,
- wherein the path selection circuit comprises:
- a first multiplexer to determine an input of a digital-to-analog converter in the ABB unit in response to the test control signal;
- a second multiplexer to determine a kind of an input of an analog filter in the ABB unit in response to the test control signal;
- a third multiplexer to determine an input of an analog-to-digital converter in the ABB unit in response to the test control signal;
- and
- a fourth multiplexer to determine an input of a digital filter in the ABB unit in response to the test control signal.
Dependencies are inferred from the claim text.