Techniques for storing accurate operating current values

Abstract

Methods of manufacturing memory devices and memory modules comprising memory device. Specifically, respective operating current values may be measured and/or stored on a plurality of memory devices. More specifically, the operating current values may be stored in programmable elements, such as antifuses, on memory devices. The memory devices may be coupled to a substrate to form a memory module. A non-volatile memory device may be coupled to the substrate. The operating current values may be read from the programmable elements and stored in the non-volatile memory device. Once the memory module is incorporated into a system, the programmable elements or non-volatile memory may be accessed such that the system can be configured to optimally operate in accordance with the operating current values measured for each memory device in the system.

Dependencies are inferred from the claim text.