System and method for testing differential signal crossover using undersampling
AssigneeTexas Instruments Incorporated
InventorDavid Guidry
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AssigneeTexas Instruments Incorporated
InventorDavid Guidry
Estimating the term…
System and method for testing differential signal crossover in high-speed electronic equipment. A preferred embodiment comprises a test circuit coupled to a device under test (DUT) and an automatic test equipment (ATE). The test circuit comprises a pair of window comparators coupled to a differential mode signal from the DUT, each window comparator configured to compare one of two signals making up the differential mode signal with a voltage boundary when enabled by an enable signal. The ATE is configured to provide clock signals to the test circuit and the DUT and to process data produced by the test circuit to determine if the differential signal crossover meets timing constraints. The test circuit uses undersampling to enable testing of high frequency signals without requiring an extremely high sampling rate.
A test circuit for testing a signal crossover in a differential mode signal, the test circuit comprising:
A test system comprising:
A method for testing a circuit for meeting signal crossover timing constraints, the method comprising:
A method for measuring a crossover voltage of a differential mode signal produced by a circuit, the method comprising:
Dependencies are inferred from the claim text.