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US 2006/0143552 A1Published application
Circuit test pattern edition apparatus, circuit test pattern editing method, and signal-bearing medium embodying a program of circuit test pattern edition
AssigneeNEC Corporation
InventorYoshihiro Konno
Life of this patent
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Abstract
An apparatus that edits a test pattern used in a circuit function test includes a generator that generates a regular pattern that includes a plurality of unit patterns, by inserting a redundant pattern into a test pattern, and a pattern number reduction editor that defines the regular pattern as one unit pattern in the circuit function test.
Claims19
An apparatus that edits a test pattern used in a circuit function test, comprising:
- a generator that generates a regular pattern that includes a plurality of unit patterns, by inserting a redundant pattern into a test pattern;
- and
- a pattern number reduction editor that defines said regular pattern as one unit pattern in said circuit function test.
A method of editing a circuit test pattern used in a circuit function test, comprising:
- generating a regular pattern that includes a plurality of unit patterns, by inserting a redundant pattern into a test pattern;
- and
- defining said regular pattern as one unit pattern in said circuit function test.
Dependencies are inferred from the claim text.