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US 2006/0140041 A1Published application
Leakage current management
AssigneeIntel Corporation
InventorsArman Vassighi, Ali Keshavarzi, Vivek De
Life of this patent
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Abstract
A thermal feedback loop controls leakage current during burn-in of a circuit.
Claims23
A circuit comprising:
- a load circuit;
- a sleep transistor coupled to the load circuit;
- and
- a feedback mechanism coupled to the sleep transistor to reduce a current in the sleep transistor when a temperature of the circuit increases.
1 more element
An integrated circuit comprising:
- a plurality of load circuits;
- a plurality of sleep transistors coupled to reduce current in the plurality of load circuits in response to a control signal;
- and
- a thermal feedback circuit to generate the control signal.
1 more element
A method comprising:
- measuring a current value in an integrated circuit;
- and
- programming a temperature sensitive voltage generator within the integrated circuit to control the current value during a burn-in test.
An electronic system comprising:
- an antenna;
- a receiver circuit coupled to receive signals from the antenna;
- and
- a processor operatively coupled to the receiver circuit, the processor comprising a plurality of load circuits, a plurality of sleep transistors coupled to reduce current in the plurality of load circuits in response to a control signal, a multiplexer to provide the control signal from a first or second signal, and a thermal feedback circuit to generate the first signal.
1 more element
Dependencies are inferred from the claim text.