Method and apparatus for discharging voltages from a circuit under test
AssigneeAgilent Technologies, Inc.
InventorsDayton Norrgard, Ronald Peiffer, Kevin Wible
Life of this patent
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AssigneeAgilent Technologies, Inc.
InventorsDayton Norrgard, Ronald Peiffer, Kevin Wible
Estimating the term…
In one embodiment, voltages are discharged from a circuit under test by, after pins of a circuit tester have been coupled to nodes of the circuit under test, making a first one of the pins an active pin and executing a current discharge process for the active pin. The current discharge process couples a current discharge circuit to the active pin, and then enables the current discharge circuit. A voltage of the active pin is then measured and, if the measured voltage is within a defined window, the active pin is coupled to ground. However, if the measured voltage is outside of the defined window after the current discharge circuit has been enabled for a predetermined period of time, the active pin is marked as not discharged. The current discharged circuit is then disabled and decoupled from the active pin. Thereafter, a next one of the pins is made the active pin, and the current discharged process is caused to be repeated.
A method of discharging voltages from a circuit under test, comprising:
A circuit tester, comprising:
A circuit tester, comprising:
Dependencies are inferred from the claim text.