Probe mark reading device and probe mark reading method
AssigneesDainippon Screen Mfg. Co., Ltd., Tokyo Electron Limited
InventorsHiromi Chaya, Takahisa Hayashi, Shigekazu Komatsu
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AssigneesDainippon Screen Mfg. Co., Ltd., Tokyo Electron Limited
InventorsHiromi Chaya, Takahisa Hayashi, Shigekazu Komatsu
Estimating the term…
A probe mark reading device for reading probe marks stormed on electrode pads of semi conductor chips contained in a semiconductor wafer (90), comprising a CCD camera (20) for taking an image of the semiconductor wafer (90) and outputting the image as an image signal Si, an optical unit (21) for optically enlarging a location to be photographed by the CCD camera (20), a light source (30) for illuminating the location to be photographed by the CCD camera (20) with a flash of light generated for a short period of time from when a flash signal Sf is provided, an X-Y stage (40) capable of changing a position to be photographed by the CCD camera (20) based on a motor control signal Sm by moving a mounted semiconductor wafer (90) in an X-direction and a Y-direction, and a computer (10) for providing control and saving the images after receiving and trimming the image signal Si. With the above configuration, it is possible to read probe marks in a short time without a user having to expend much time or effort.
1-9. (canceled)
A probe mark test device for checking probe marks formed on electrode pads during checking of electrical characteristics of a prescribed object including a plurality of electrode pads, comprising:
11-14. (canceled)
A probe mark test method for checking probe marks formed on electrode pads during checking of electrical characteristics of a prescribed object including a plurality of electrode pads, comprising:
Dependencies are inferred from the claim text.