Semiconductor device connector, semiconductor device carrier, semiconductor device socket using the same and probe card

A semiconductor device carrier comprising;

• a carrier housing having a housing portion for accommodating a semiconductor device;
• an electrode sheet disposed in said carrier housing, having a front surface wiring conductively wired on a front surface of an insulation substrate, a rear surface wiring conductively wired on a rear surface of said insulation substrate, a rear surface bump contact placement wiring formed on said rear surface wiring, and a bump contact disposed in a contact placement portion on said front surface wiring to be in contact with an electrode section of said semiconductor device;
• a pressing member held by said carrier housing, for pressing said semiconductor device housed therein onto said electrode sheet;
• and
• an elastic sheet disposed in said carrier housing to be in contact with the bottom of said electrode sheet;
• wherein
• a width of said rear surface bump contact placement wiring in correspondence to a bump contact to be in contact with an extreme electrode section of said semiconductor device is smaller than a width of said front surface bump contact placement wiring on which a bump contact to be in contact with the extreme electrode section is arranged.

A semiconductor device carrier comprising:

• a carrier housing having a housing portion for accommodating a semiconductor device;
• an electrode sheet disposed in said carrier housing, having a front surface wiring conductively wired on an insulation substrate, and a bump contact disposed on said front surface wiring to be in contact with an electrode section of said semiconductor device;
• a pressing member held by said carrier housing, for pressing said semiconductor device housed therein onto said electrode sheet;
• and
• an elastic sheet disposed in said carrier housing to be in contact with the bottom of said electrode sheet;
• wherein
• a width of a contact placement portion on which said bump contact to be in contact with the extreme electrode section of said semiconductor device is smaller than a width of a contact placement portion arranged in the adjacent bump contact.

A probe card comprising:

• an electrode sheet disposed on a surface of an insulation substrate and having a plurality of groups of bump contacts constituted by a set of bump contacts to be in contact with an electrode section of a wiring pattern on a semiconductor device and a rear surface bump contact placement wiring formed on said rear surface of said insulation substrate, said rear surface bump contact placement wiring connected to said bump contacts;
• an anisotropic conductive sheet disposed to be in contact with the surface of said electrode sheet on which the rear surface bump contact placement wiring is formed, the sheet being put in a conductive state when pressed through said electrode sheet;
• and
• a wiring board electrically connected to the electrode section of said semiconductor device through said electrode sheet and said anisotropic conductive sheet, wherein
• a width of said rear surface bump contact placement wiring in correspondence to a bump contact to be in contact with an extreme electrode section of said semiconductor device is smaller than a width of a rear surface bump placement wiring formed in association with a bump contact adjacent to said bump contact.