Loading patent…
OwnerYoung-chan Kiminventor
Estimating the term…
An image sensor test pattern provides time efficient optical testing of CMOS image senors at a single luminous intensity. These test patterns include at least first and second arrays of pixels having different light-accumulating characteristics. The different light-accumulating characteristics may be achieved multiple different ways. In some cases, the photodiodes in the first array of pixels are larger than photodiodes in the second array of pixels. In other cases, the photodiodes in the first array of pixels have open holes of a first size and the photodiodes in the second array of pixels have open holes of a second size less than the first size. In still other cases, the photodiodes in the first array of pixels have colors filters of a first density (or first thickness) and the photodiodes in the second array of pixels have color filters of a second density (or second thickness) less than the first density (or first thickness).
An image sensor test pattern, comprising:
A test pattern of optical characteristics of a CMOS image sensor, the test pattern comprising:
A test pattern of optical characteristics of a CMOS image sensor, the test pattern comprising:
A test pattern of optical characteristics of a CMOS image sensor, the test pattern comprising:
A test method of optical characteristics of a CMOS image sensor, the method comprising:
A test method of optical characteristics of a CMOS image sensor, the method comprising:
A test method of optical characteristics of a CMOS image sensor, the method comprising:
Dependencies are inferred from the claim text.