Ion-implanting apparatus, ion-implanting method, and device manufactured thereby
AssigneeMatsushita Electric Industrial Co., Ltd.
InventorsYuichiro Sasaki, Bunji Mizuno
Life of this patent
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Abstract
An ion-implanting apparatus and method that can dynamically control a beam current value with time and does not change energy. This ion-implanting apparatus controls a dynamic change in beam current value with time by giving feedback on the beam current value measured with a beam current measuring means.
Claims23
An ion-implanting apparatus, wherein the apparatus controls a variation in a beam current value by giving feedback on the beam current value measured by a beam current measuring means to at least one parameter selected from a group consisting of a shape of an ion outlet provided in an arc chamber of an ion source, a position of an extracting electrode, dopant gas flow, dopant gas pressure, current and voltage applied to a filament, arc voltage, arc current, magnetic field strength for trapping an electron inside of the arc chamber, and a position of the arc chamber.
An active device, such as a semiconductor, liquid crystal, and biochip, and a passive device, such as a resistor, coil, and capacitor both manufactured by a ion-implanting apparatus, wherein the apparatus controls a variation in a beam current value by giving feedback on the beam current value measured by a beam current measuring means to at least one parameter selected from a group consisting of a shape of an ion outlet provided in an arc chamber of an ion source, a position of an extracting electrode, dopant gas flow, dopant gas pressure, current and voltage applied to a filament, arc voltage, arc current, magnetic field strength for trapping an electron inside of the arc chamber, and a position of the arc chamber.
An ion-implanting method comprising a step of controlling a variation in a beam current value by giving feedback on the beam current value measured by a beam current measuring means to at least one parameter selected from a group consisting of a shape of an ion outlet provided in an arc chamber of an ion source, a position of an extracting electrode, dopant gas flow, dopant gas pressure, current and voltage applied to a filament, arc voltage, arc current, magnetic field strength for trapping an electron inside of the arc chamber, and a position of the arc chamber.
Dependencies are inferred from the claim text.