Method of testing scan chain integrity and tester setup for scan block testing

A computer program product for scan chain integrity testing comprising:

• a medium for embodying a computer program for input to a computer;
• and
• a computer program embodied in the medium for causing the computer to perform steps of:
• (a) receiving as input an integrated circuit design;
• (b) generating a partial shift test bench for the integrated circuit design wherein the partial shift test bench includes scan chains stitched together into shift registers and a scan block;
• (c) parallel loading the scan chains with a set of test vectors from the scan block with an offset of N bits wherein N is a number greater than one and less than the maximum length of the scan chains;
• (d) shifting the test vectors into the last N bits of the scan chains with N scan clock pulses;
• (e) comparing outputs of the scan chains with expected values in the scan block to produce a scan chain integrity test result;
• and
• (f) generating as output the scan chain integrity test result.