Method for performing a function test of a position measuring system and position measuring system for executing the method
AssigneeDr. Hohannes Heidenhain GmbH
InventorErich Strasser
Life of this patent
Estimating the term…
Loading patent…
AssigneeDr. Hohannes Heidenhain GmbH
InventorErich Strasser
Estimating the term…
A method for performing a functional test of a position measuring system, which in the course of scanning a scale by a position measuring unit generates position values. The method includes generating a control value in the position measuring system, the control value having a defined mathematical interrelationship with one of the position values and into which a correction value stored in the position measuring system is entered as a parameter. Transmitting the control value and an associated position value to an evaluation unit located downstream of the position measuring system. Making a check in the evaluation unit to determine whether there is a mathematical interrelationship between the control value and the associated position value. Storing the correction value in the position measuring system under a first memory address and a second memory address. Accessing the correction value at the first memory address for forming a definite mathematical interrelationship between the control value and the associated position value, wherein the making a check includes having the evaluation unit access the correction value at the second memory address.
A method for performing a functional test of a position measuring system, which in the course of scanning a scale by a position measuring unit generates position values, the method comprising:
A position measuring system comprising:
Dependencies are inferred from the claim text.