Tailoring channel strain profile by recessed material composition control
AssigneeTexas Instruments Incorporated
InventorElisabeth Koontz
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AssigneeTexas Instruments Incorporated
InventorElisabeth Koontz
Estimating the term…
The present invention facilitates semiconductor fabrication by providing methods of fabrication that tailor applied strain profiles to channel regions of transistor devices. A strain profile is selected for the channel regions (104). Recessed regions are formed (106) in active regions of a semiconductor device after formation of gate structures according to the selected strain profile. A recess etch (106) is employed to remove a surface portion of the active regions thereby forming the recess regions. Subsequently, a composition controlled recess structure is formed (108) within the recessed regions according to the selected strain profile. The recess structure is comprised of a strain inducing material, wherein one or more of its components are controlled and/or adjusted during formation (108) to tailor the applied vertical channel strain profile.
A method of fabricating a semiconductor device comprising:
A method of fabricating a semiconductor device comprising:
A method of forming a composition controlled recess structure comprising:
Dependencies are inferred from the claim text.