Systems and methods for rectifying and detecting signals
AssigneeHewlett-Packard Development Company, L.P.
InventorsCarl Picciotto, Peter Hartwell
Life of this patent
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Abstract
A first device has a surface and includes a plurality of at largest micrometer-scale geometry structures extending along its surface. The structures have a first portion and a second portion. A plurality of at largest micrometer-scale geometry conductors are coupled to the first portion of respective structures. A converter converts a signal in the first portion of the structures to a substantially direct current signal in the respective second portion. A sensor detects a level of a signal coupled from one of the conductors to a respective one of the structures.
Claims39
A system comprising:
- a first device having a plurality of at largest micrometer-scale geometry structures, the structures having a first portion and a second portion;
- a plurality of at largest micrometer-scale geometry conductors coupled to the first portion of respective structures;
- a converter for converting a signal in the first portion of the structures to a substantially direct current signal in the respective second portion;
- and
- a sensor for detecting a level of a signal coupled from one of the conductors to a respective one of the structures.
A system comprising:
- a first device having a plurality of at largest micrometer-scale geometry structures, the structures having a first portion and a second portion;
- a plurality of at largest micrometer-scale geometry conductors coupled to the first portion of respective structures;
- first means for converting a signal in the first portion of the structures to a substantially direct current signal in the respective second portion;
- and
- second means for detecting a level of a signal coupled from one of the conductors to a respective one of the structures.
A method for determining the impedance of one of a plurality of adjacent at largest micrometer-scale geometry structures, the structures each having a first portion and a second portion, comprising:
- coupling a plurality of at largest micrometer-scale geometry conductors to the first portions of respective structures wherein a signal is transmitted from the conductors to the first portions of the respective structures;
- converting the signal in the first portion of each of the structures to a substantially direct current signal in the respective second portion;
- detecting a level of a signal coupled from one of the conductors to a respective one of the structures;
- and
- generating an impedance value corresponding to the respective one of the structures in response to the detected level of the signal.
A method of determining an amount of particles on a surface of a device having a plurality of at largest micrometer-scale geometry structures extending along the surface of the device comprising:
- coupling a plurality of at largest micrometer-scale geometry conductors to first portions of respective structures wherein a signal is transmitted from the conductors to the first portions of the respective structures;
- converting the signals in the first portions of the structures to substantially direct current signals in respective second portions of the structures;
- detecting a level of the signal transmitted to the first portion of one of the structures;
- generating an impedance value corresponding to the one of the structures in response to the detected level of the signal;
- and
- generating a particle amount value corresponding to the impedance value.
Dependencies are inferred from the claim text.