Extracting phase error in waveguides
AssigneeIntel Corporation
InventorsEverett Wang, Sai Yu, Yi Ding, Dmitri Nikonov
Life of this patent
Estimating the term…
Abstract
Provided are a method and a system, wherein optical beams of a plurality of wavelengths are directed through a plurality of optical devices, wherein waveguides comprising the optical devices have different fabrication errors, and wherein the waveguides have a plurality of waveguide lengths and a plurality of waveguide widths. Optical phase errors corresponding to the waveguides are measured by the optical devices. A determination is made of the components of the optical phase errors for the waveguides from the measured phase errors.
Claims30
A method, comprising:
- directing optical beams of a plurality of wavelengths through a plurality of optical devices, wherein waveguides comprising the optical devices have different fabrication errors, and wherein the waveguides have a plurality of waveguide lengths and a plurality of waveguide widths;
- measuring, by the optical devices, optical phase errors corresponding to the waveguides;
- and
- determining components of the optical phase errors for the waveguides from the measured phase errors
A system, comprising:
- a plurality of optical devices, wherein optical beams of a plurality of wavelengths are directed through the plurality of optical devices;
- and
- waveguides included in the plurality of optical devices, wherein the waveguides have different fabrication errors, wherein the waveguides have a plurality of waveguide lengths and a plurality of waveguide widths, wherein the optical phase errors corresponding to the waveguides are measured by the optical devices, and wherein components of the optical phase errors for the waveguides are determined from the measured phase errors.
A system, comprising:
- a laser diode light source;
- a plurality of optical devices, wherein optical beams of a plurality of wavelengths from the laser diode light source are directed through the plurality of optical devices;
- and
- waveguides included in the plurality of optical devices, wherein the waveguides have different fabrication errors, wherein the waveguides have a plurality of waveguide lengths and a plurality of waveguide widths, wherein the optical phase errors corresponding to the waveguides are measured by the optical devices, and wherein components of the optical phase errors for the waveguides are determined from the measured phase errors.
Dependencies are inferred from the claim text.