Novel hard bias design for sensor applications
AssigneeHeadway Technologies, Inc.
InventorsKunliang Zhang, Mao-Min Chen, Chyu-Jiuh Torng, Min Li, Chen-Jung Chien
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AssigneeHeadway Technologies, Inc.
InventorsKunliang Zhang, Mao-Min Chen, Chyu-Jiuh Torng, Min Li, Chen-Jung Chien
Estimating the term…
A hard bias structure for biasing a free layer in a MR element within a magnetic read head is comprised of a soft magnetic underlayer such as NiFe and a hard bias layer comprised of Co78.6Cr5.2Pt16.2 or Co65Cr15Pt20 that are rigidly exchange coupled to ensure a well aligned longitudinal biasing direction with minimal dispersions. The hard bias structure is formed on a BCC seed layer such as CrTi to improve lattice matching. The hard bias structure may be laminated in which each of the underlayers and hard bias layers has a thickness that is adjusted to optimize the total HC, Mrt, and S values. The present invention encompasses CIP and CPP spin values, MTJ devices, and multi-layer sensors. A larger process window for fabricating the hard bias structure is realized and lower asymmetry output and NBLW reject rates during a read operation are achieved.
A method of forming a hard bias structure in a magnetic read head based on an MR element, comprising:
A method of forming a laminated hard bias structure in a magnetic read head based on an MR element, comprising:
Dependencies are inferred from the claim text.