Detection device, optical path length measurement device, measurement instrument, optical member evaluation method, and temperature change detection method
AssigneeFujikura Ltd.
InventorKensuke Ogawa
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AssigneeFujikura Ltd.
InventorKensuke Ogawa
Estimating the term…
An object of the invention is to provide a detection apparatus, an optical path length measuring apparatus, a method for evaluating an optical member, and the like, which can evaluate optical characteristics such as chromatic dispersion and an optical path length at a high speed. Another object is to provide a detection apparatus and a method for detecting a change in temperature, which can evaluate chemical and biological reactions and an effect of hyperthermia with high accuracy. In a detection apparatus 10A, zero-order light B0 undergoing chromatic dispersion of a measurement object S is superimposed on first-order light B1 shifted in frequency, whereby a low-frequency beat is produced, and wavelength dependence of a beat phase thereof is measured. Moreover, using an AC electric signal from a frequency shifter 12 as a phase reference signal, a relative position of a probe signal is detected. In addition, it is effective to shift the frequencies of probe light and reference light having mutually different wavelengths and determine a beat phase of probe light in a relative manner on the basis of a beat phase of reference light.
A detection apparatus characterized by comprising:
A detection apparatus characterized by comprising:
A detection apparatus characterized by comprising:
An optical path length measuring apparatus characterized by comprising:
A device for measurement which is used in a measurement apparatus irradiating a measurement object with probe light having a predetermined wavelength and reference light having a wavelength different from the wavelength of the probe light, and measuring optical characteristics of said measurement object, characterized in that when said measurement object reflects light in a wavelength range including the wavelength of said probe light and not including the wavelength of said reference light, said device for measurement is placed before or after said measurement object in a direction in which said measurement object is irradiated with said probe light and said reference light, and reflects light in a wavelength range including the wavelength of said reference light and different from a wavelength range in which light is reflected by said measurement object.
A method for evaluating an optical member characterized by comprising the steps of:
A method for evaluating an optical member characterized by comprising the steps of:
A method for detecting a change in temperature characterized by comprising the steps of:
A method for detecting a change in temperature characterized by comprising the steps of:
Dependencies are inferred from the claim text.