Fiber optic sensor
AssigneeHalliburton Energy Services, Inc.
InventorsRoger Schultz, Neal Skinner, Harry Smith, Daniel Gleitman
Life of this patent
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Abstract
An apparatus, system and method are provided for measuring state properties without requiring an internal or proximate power supply. The apparatus provides a sensing device that is responsive to fluctuations in a state property that are encountered within the test zone. Due to the fluctuations experienced by the sensing device, a sensing signal is generated and transmitted to an optical device, such as an interferometer. The sensing signal's affect on the optical device produces an interference pattern that may be detected remotely and correlated to the fluctuation experienced by the sensing device.
Claims73
A sensor comprising:
- a sensing device that generates a sensing signal in response to a change in a state property;
- a moveable plate moving in response to the sensing signal generated by the sensing device, the moveable plate further having a mirror, the mirror defining an end of a Fabry-Perot cavity;
- and
- one or more filaments operative with the Fabry-Perot cavity to transmit one or more light signals;
- wherein, when the sensing device generates a sensing signal, the mirror is moved to affect the Fabry-Perot cavity.
A system for measuring a state property comprising:
- a sensor, the sensor having a sensing device coupled with an interferometer that produces an interference pattern, the interference pattern changes in response to changes in a sensing signal generated by the sensing device;
- a light source, the light source to emit a light signal;
- and
- one or more filaments extending from the light source to the interferometer, the one or more filaments to transmit the light signal to the interferometer and to transmit an interference pattern to a detector wherein fluctuations in the state property experienced by the sensing device cause the interferometer to change the interference pattern.
A method comprising:
- providing a sensor having a sensing device coupled to an interferometer;
- providing a light source and a detector;
- providing one or more filaments connecting the sensor to the light source and to the detector, one or more of the filaments transmit a source signal from the light source to the sensor and one or more of the filaments transmit an interference pattern from the sensor to the detector;
- placing the sensor into a test zone;
- sending the source signal from the light source to the sensor;
- receiving by the detector the interference pattern from the sensor;
- and
- analyzing the interference pattern to determine a change in a state property experienced by the sensor.
A sensor comprising:
- a sensing device that generates a sensing signal in response to a change in a state property experienced by the sensor;
- an interferometer operative with the sensing device, the interferometer to change an interference pattern in response to the sensing signal;
- and
- a filament coupling the interferometer to a detector;
- wherein the detector measures changes in the interference pattern in response to the sensing signal.
A system for measuring a state property comprising:
- a sensor, the sensor having a sensing device coupled to an interferometer having a grating that produces an interference pattern, the interference pattern changes in response to changes in a sensing signal generated by the sensing device;
- a light source, the light source to emit a light signal;
- and
- one or more filaments extending from the light source to the interferometer, the one or more filaments transmit the light signal to the interferometer and the one or more filaments transmit an interference pattern to a detector wherein fluctuations in the state property experienced by the sensing device cause the interferometer to change the interference pattern that is transmitted to the detector.
A system for measuring a state property comprising:
- a sensor, the sensor having a sensing device coupled to an evanescence interferometer that produces an interference pattern, the interference pattern changes in response to changes in a sensing signal generated by the sensing device;
- a light source, the light source to emit a light signal;
- and
- one or more filaments extending from the light source to the interferometer, the one or more filaments transmit the light signal to the interferometer and the one or more filaments transmit an interference pattern to a detector wherein fluctuations in the state property experienced by the sensing device cause the interferometer to change the interference pattern.
Dependencies are inferred from the claim text.