Full width array mechanically tunable spectrophotometer
AssigneeXerox Corporation
InventorsLalit Mestha, Yao Wang, Joel Kubby
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AssigneeXerox Corporation
InventorsLalit Mestha, Yao Wang, Joel Kubby
Estimating the term…
Apparatus and methods are provided for implementing a full width array material scanning spectrophotometer by integrating a Fabry-Perot cavity filter with a silicon photodetector and a light focusing device (an optical guide or a SELFOC® lens). The material to be scanned is illuminated by a broad band illumination source (white LEDs or a fluorescence light source). The Fabry-Perot cavity gap can be tuned electromechanically to get multiple measurements to resolve the spectral distribution of the transmitted light signal. The array spectrophotometric architecture facilitates an elongated, substantially linear band detection and the associated spectral reconstruction technique resolves spectral distribution in the presence of multiple resonant peaks.
A full width array spectrophotometer (FWAS) for scanning analysis of a material, comprising an illumination source for illuminating the material, and an array of microelectronically tunable spectrophotometers comprising an array of more than one closely spaced tunable spectrophotometer adjacent to the illumination source, said spectrophotometers being positioned to receive light reflected from the material.
A method of full width scanning analysis of a transversely extensive test target in a test target path with a full width array spectrophotometer, comprising:
A method of full transverse scanning color analysis of color printed sheets moving in a color printer path with a full width array spectrophotometer, comprising:
A method for generating a reflectance spectra from a selected set of sampled signals reflected from a material and transmitted through an optical filter comprising:
Dependencies are inferred from the claim text.