Integrated optoelectronic system for measuring fluorescence or luminescence emission decay

An apparatus comprising:

• a light source being a light emitting diode, a semiconductor laser or a flash tube;
• an integrated circuit operable to cause the light source to emit light pluses towards a sample which causes a fluorescence or luminescence emission from the sample;
• a photodiode detecting the emission;
• a detection analysis system determining information about the sample by analyzing decay of the detected emission;
• and
• an enclosure enclosing the light source;
• the integrated circuit, the photodiode and the detection analysis system.

An apparatus comprising:

• a light source being a light emitting diode, a semiconductor laser or a flash tube;
• a first integrated circuit operable to cause the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample;
• a photodiode detecting the emission;
• a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission;
• and
• an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.

An apparatus comprising:

• a light source emitting light pulses towards a sample which cause a fluorescence or luminescence emission from the sample;
• a detector detecting the emission;
• a detection analysis system determining information about the sample by analyzing decay of the detected emission;
• a first lens directing the light pulses from the light source towards the sample;
• a second lens directing the emission from the sample towards the detector;
• and
• an enclosure enclosing the light source, the detector, the detection analysis system, the first lens and the second lens, wherein the light source, the detector, the first lens and the second lens are properly aligned inside the enclosure.