High speed analog envelope detector
AssigneeSamsung Electronics Co., Ltd.
InventorJae-Suk Yu
Life of this patent
Estimating the term…
Loading patent…
AssigneeSamsung Electronics Co., Ltd.
InventorJae-Suk Yu
Estimating the term…
A high speed analog transmission envelope (data-validity) detector for detecting the validity or invalidity of received data by generating (and comparing) first through fourth level-shifted signals based on a pair of differential input signals that are externally applied (received). Each of the first through fourth level-shifted signals has voltage levels different from (e.g., higher than) the differential input signals. After comparing the first through fourth level-shifted signals with each other, the comparison results are used in determining the validity of the differential input signals (data). The analog transmission envelope (data) detector flexibly adapts to variations in common mode voltage, and simplifies the circuit architecture because it does not require an additional reference voltage for determining the validity of received data.
A data detector comprising:
A data-validity detector comprising:
Dependencies are inferred from the claim text.