Using a parametric measurement unit to sense a voltage at a device under test
AssigneeTeradyne, Inc.
InventorsErnest Walker, Ron Sartschev
Life of this patent
Estimating the term…
Abstract
Circuitry for use in testing a device includes a first measurement unit to apply a forced voltage to the device, and a second measurement unit having functionality that is disabled. The second measurement unit includes a sense path to receive a sensed voltage from the device, where the sense path connects to the first measurement unit through the second measurement unit. The first measurement unit adjusts the forced voltage based on the sensed voltage.
Claims23
Circuitry for use in testing a device, comprising:
- a first measurement unit that is capable of applying a forced signal to a pin on the device;
- and
- a second measurement unit comprising circuitry that is substantially similar to circuitry in the first measurement unit but configured differently, the second measurement unit being configurable to provide a sense path to receive a sensed voltage from the pin on the device in response to the forced signal from the first measurement unit, the sense path connecting to the first measurement unit through a forced signal supply path of the second measurement unit;
- wherein the first measurement unit is capable of adjusting the forced signal based on the sensed voltage.
A method of testing a device, comprising:
- configuring a second measurement unit to provide a sense path between a pin of the device and a first measurement unit, the sense path being along a voltage supply path of the second measurement unit;
- applying a first voltage to the pin of the device via the first measurement unit;
- sensing a second voltage at the pin of the device via the sense path, the second voltage corresponding to a difference between the first voltage and a voltage drop experienced as a result of applying the first voltage to the device;
- and
- adjusting the first voltage in accordance with the second voltage;
- wherein the first measurement unit and the second measurement unit comprise substantially similar circuitry that is configured differently to perform different functions.
(canceled)
(canceled)
Automatic test equipment for use with a device under test, the automatic test equipment comprising:
- plural parametric measurement units for use in regulating voltages applied to the device under test, the plural parametric measurement units comprising:
- a first parametric measurement unit configured to force a voltage to a pin of the device under test;
- and
- a second parametric measurement unit configured to provide a sense path for the first parametric measurement unit along a voltage supply path of the second parametric measurement unit, the sense path for receiving a sensed voltage from the pin of the device in response to the voltage forced by the first parametric measurement unit and for applying the sensed voltage to the first parametric measurement unit, the second parametric measurement unit having substantially same circuitry as the first parametric measurement unit but a different configuration.
(canceled)
Dependencies are inferred from the claim text.