Using parametric measurement units as a source of power for a device under test

An apparatus for applying power to a device under test, comprising:

• plural parametric measurement units, the plural parametric measurement units comprising substantially same circuitry, each of the plural parametric measurement units being configurable to operate as a current source to power the device under test or as a sensing device, the plural parametric measurement units comprising:
• a first parametric measurement unit configured to sense a voltage at the device, the first parametric measurement unit comprising a sense path that taps a voltage at the device under test;
• and
• at least one additional parametric measurement unit configured to operate as a current source, the at least one additional parametric measurement unit receiving voltage via the first parametric measurement unit and providing output current based on the voltage received via the first parametric measurement unit.

A method of providing current to a device under test, comprising:

• sensing an output current provided to a device under test;
• providing a voltage that corresponds to the output current as input to plural parametric measurement units;
• outputting current from each of the plural parametric measurement units, the current from each parametric measurement unit being based on the voltage;
• and
• combining currents from the plural parametric measurement units at the device under test.

An apparatus for providing current to a device under test, comprising:

• a first parametric measurement unit configured to provide current to the device;
• a second parametric measurement unit configured to provide current to the device, the current from the second parametric measurement unit augmenting the current from the first parametric measurement unit at the device;
• and
• a third parametric measurement unit configured to sense a voltage at the device, the voltage being input to the first parametric measurement unit.