Contact-type film probe
AssigneeWintek Corporation
InventorChih-Yuan Wang
Life of this patent
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Abstract
A contact-type film probe including a plastic substrate. Multiple signal transmission lines are arranged on one face of the substrate. Each signal transmission line penetrates through a section of the substrate near one end thereof. Each signal transmission line is coated with an insulating layer. A conductive layer is disposed on the other face of the substrate corresponding to each signal transmission line. The conductive layer is electrically connected with the signal transmission line. A contact conductive layer is further overlaid on each conductive layer. The contact conductive layers serve to directly electrically contact with the wires of the liquid crystal display to be tested.
Claims6
A contact-type film probe comprising:
- a plastic substrate having first and second opposing faces;
- multiple signal transmission lines being arranged on the second face of the substrate, each signal transmission line penetrating through a section of the substrate near one end thereof;
- an insulating layer disposed on each signal transmission line;
- a plurality of conductive layers being disposed on the first face of the substrate in respective correspondence with the penetration of the signal transmission lines through the substrate, each conductive layer being electrically connected with the corresponding signal transmission line;
- and
- a contact conductive layer being further overlaid on each conductive layer and having an outer contact surface, each signal transmission line being spaced from the outer contact surface of a corresponding contact conductive layer by a combined thickness of the substrate, a respective conductive layer, and the corresponding contact conductive layer.
Dependencies are inferred from the claim text.