Eddy current probe and inspection method

A system for inspecting a component, said system comprising:

• an eddy current (EC) probe comprising:
• a tangential drive coil configured to generate a probing field for inducing a plurality of eddy currents in the component, a portion of the eddy currents being aligned parallel to an edge of the component, wherein an axis of said tangential drive coil is aligned parallel to a surface of the component;
• a pair of sense coils, wherein an axis of said sense coils is aligned perpendicular to the surface of the component, and wherein said sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component;
• and
• a control unit coupled to said EC probe and configured for controlling motion of said EC probe.