Loading patent…
AssigneeGeneral Electric Company
InventorsChangting Wang, Yuri Plotnikov, William McKnight, Shridhar Nath, Gigi Gambrell, Mottito Togo, William Hennessy, John Ertel, Shyamsunder Mandayam
Estimating the term…
Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
An eddy current (EC) probe comprising:
An eddy current array probe (ECAP) comprising:
An eddy current (EC) array probe (ECAP) for inspecting a component for flaws, said ECAP comprising:
An eddy current (EC) array probe (ECAP) for inspecting a component for flaws, said ECAP comprising:
Dependencies are inferred from the claim text.