Integrated circuit test probe
AssigneeEuropean Aeronautic Defence and Space Company Eads France and Eads CCR Groupement d'Interet Economique
InventorOlivier Maurice
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Abstract
A method and apparatus for testing integrated circuits by subjecting the circuits to an electromagnetic disturbance. A probe is provided, equipped with a horn cover designed to be applied to a printed circuit on which an integrated circuit is mounted. Within this horn cover, a core shield channels the electrical field that is deployed in a zone in which connections from the integrated circuit to the printed circuit that it carries are situated. The effectiveness of the electromagnetic interference injected in the integrated circuit is increased to the point that a true measurement of the resistance of this integrated circuit to the electromagnetic interferences may be carried out.
Claims9
A test probe for an integrated circuit that is carried by a printed circuit, the probe comprising a radiofrequency signal generator, an antenna, a power circuit for connecting the antenna to the generator, and means for disposing the antenna opposite from the connections situated in the periphery of an integrated circuit to be tested, to emit (E, B) these radiofrequency signals over these connections, the antenna comprising a wave guide with a horn cover and a core shield, the horn cover having an opening surface that is larger than a span of a surface of a housing of the integrated circuit to be tested, the core shield having a flaring whose sectional surface at the location of its extremity is less at the surface of a housing of the integrated circuit to be tested, means being provided to place the horn cover against the printed circuit, and the core shield, within the horn cover, above the component.
Dependencies are inferred from the claim text.