Method of determining the cause of an error state in an apparatus
AssigneeNCR Corporation
InventorsSimon Forrest, Jon Timmis, Rogerio de Lemos, Modupe Ayara
Life of this patent
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AssigneeNCR Corporation
InventorsSimon Forrest, Jon Timmis, Rogerio de Lemos, Modupe Ayara
Estimating the term…
A method is described for determining the cause of an error state for one or more components within an apparatus. The apparatus comprises a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors. The method comprises analysing said sensor information in the form of an error log to ascertain sensor patterns from said sensor information comparing said sensor patterns with detectors, which are predefined patterns, indicative of the condition of said one or more components within the apparatus and classifying said sensor patterns as being indicative of said error state of a component or not based upon a comparison of sensor patterns with said detectors.
A method of determining the cause of an error state for one or more components within an apparatus comprising a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors, the method comprising:
A computer program for determining the cause of an error state of one or more components within an apparatus comprising a plurality of sensors arranged to monitor the operation of components of the apparatus and a control means arranged to receive said information from said plurality of sensors, the program being adapted to:
Dependencies are inferred from the claim text.