Semiconductor device employing fuse circuit and method for selecting fuse circuit system

A fuse circuit selection method for selecting a fuse circuit for use out of plural types of fuse circuits configured to be capable of storing addresses different from each other based on a same cutting pattern of plural program fuses, the method comprising:

• counting the number of cut program fuses necessary in a case of allowing each fuse circuit to store a predetermined address for each type of the fuse circuits;
• and
• preferentially assigning, as a fuse circuit for the predetermined address, a fuse circuit capable of storing the predetermined address by a smaller number of cut program fuses.

A fuse circuit selection method for selecting a fuse circuit for use from plural fuse circuits including first and second types of fuse circuits configured to be capable of storing addresses different from each other based on a same cutting pattern of plural program fuses,

• wherein, for at least a part of bits constituting the address to be stored, it is determined which of the number of bits having one logical values and the number of bits having other logical values is larger, when the number of bits having the one logical values is larger, the first type of fuse circuits is selected, and when the number of bits having the other logical values is larger, the second type of fuse circuits is selected.