Loading patent…
AssigneeElpida Memory, Inc.
InventorsMakoto Kitayama, Yosuke Kawamata
Estimating the term…
Disclosed are a semiconductor device capable of reducing the number of program fuses used therein, and a fuse circuit selection method. The semiconductor device includes at least one first fuse circuit including: a storage circuit group which stores a desired address based on a cutting pattern of the plural program fuses; a hit detection unit which detects a match between the address stored in the storage circuit group and a selected address; and a use determination unit which activates the hit detection unit in response to the fact that at least one of the program fuses is cut. As described above, the first fuse circuit determines whether the first fuse circuit is in a used state or in an unused state depending on whether or not the program fuse itself is cut. Accordingly, an enable fuse becomes unnecessary.
A semiconductor device comprising at least one first fuse circuit, the first fuse circuit including:
A fuse circuit selection method for selecting a fuse circuit for use out of plural fuse circuits including first and second types of fuse circuits configured to be capable of storing addresses different from each other based on a same cutting pattern of plural program fuses, the method comprising:
A fuse circuit selection method for selecting a fuse circuit for use out of plural fuse circuits including first and second types of fuse circuits configured to be capable of storing addresses different from each other based on a same cutting pattern of plural program fuses, the method comprising:
Dependencies are inferred from the claim text.