Line short localization in LCD pixel arrays
AssigneeApplied Materials, Inc.
InventorsMatthias Brunner, Young Ko
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Abstract
A method and apparatus for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors. The method includes locating the two or more signal lines having the short, locating one or more defective pixels disposed between the two or more signal lines having the short, and identifying the defective pixels as the location of the short.
Claims29
A method for identifying a location of a short between two or more signal lines on a substrate having a plurality of thin film transistors and a plurality of pixels associated with the thin film transistors, comprising:
- locating the two or more signal lines having the short;
- locating one or more defective pixels disposed between the two or more signal lines having the short;
- and
- identifying a location of the defective pixels as the location of the short.
A method of locating a short between at least two signal lines on a flat panel substrate having a plurality of pixels coupled to a plurality of signal lines, comprising:
- applying a first voltage to a portion of the plurality of signal lines;
- identifying a short between at least two signal lines within the plurality of signal lines;
- sensing a pixel voltage from a portion of the plurality of pixels coupled to the at least two signal lines;
- and
- isolating the location of short based on the pixel voltage.
An apparatus for locating a short between at least two signal lines on a flat panel substrate having a plurality of pixels coupled to a plurality of signal lines, comprising:
- a prober;
- a signal measurement device;
- a power source;
- and
- a controller configured to locate the at least two or signal lines having the short from within the plurality of signal lines, locate one or more defective pixels disposed between the at least two signal lines having the short, and identifying the defective pixels as the location of the short.
Dependencies are inferred from the claim text.