Test apparatus
OwnerAtsunori Shibuyainventor
Life of this patent
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Abstract
A test apparatus for testing electronic devices, comprising a control section for generating control signals based on a test program set in advance to test the electronic devices, a plurality of test modules for generating test signals to be supplied to the electronic devices on the basis of the control signals, a device interface having connectors, provided in correspondence to the plurality of test modules, for supplying the test signals generated by corresponding test modules to predetermined pins of the electronic devices, wherein a test module for generating source power to be supplied to the electronic device outputs the source power only when it is connected with a connector set in advance among the plurality of connectors and does not output source power when it is not connected with the connector set in advance.
Claims6
A test apparatus for testing electronic devices, comprising:
- a control section for generating control signals based on a test program set in advance to test said electronic devices;
- a plurality of test modules for generating test signals to be supplied to said electronic devices on the basis of the control signals;
- and
- a device interface having connectors, provided in correspondence to the plurality of test modules, for supplying the test signals generated by said corresponding test modules to predetermined pins of said electronic devices;
- wherein
- said test module for generating source power to be supplied to said electronic devices outputs the source power only when it is connected with the connector set in advance among the plurality of connectors and does not output source power when it is not connected with said connector set in advance.
Dependencies are inferred from the claim text.