Laser dicing device
AssigneeTokyo Seimitsu Co., Ltd.
InventorsMasayuki Azuma, Yasuyuki Sakaya
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AssigneeTokyo Seimitsu Co., Ltd.
InventorsMasayuki Azuma, Yasuyuki Sakaya
Estimating the term…
There is provided a laser dicing apparatus comprising: a first position detecting device detecting a position of the surface of a wafer at an incident point of laser light; second position detecting device detecting in advance a position of the surface of the wafer; and a control section controlling the position in the thickness direction of a condensing point inside the wafer, wherein the control section, when scanning the laser light from the outside of a periphery of the wafer to the inside of the periphery of the wafer, performs control based on data obtained with the second position detecting device detecting the position of the condensing point at the periphery of the wafer, and after scanning a predetermined distance, switches to perform control based on data obtained by the first position detecting device. Thereby, when the laser light is made incident through the surface of the wafer and scanned, the position control of the condensing point of the laser light can be performed even at the periphery of the wafer, and a modified region by multi-photon absorption can be formed at a predetermined position inside the wafer.
A laser dicing apparatus making laser light, of which condensing point is arranged to the inside of a wafer, incident through the surface of said wafer while scanning the laser light, and dicing said wafer by forming a modified region inside said wafer to divide said wafer into individual chips, said laser dicing apparatus comprising:
Dependencies are inferred from the claim text.