Method for testing assembling quality of optical storage devices and optical storage device for using such method

An optical storage device capable of self-testing assembling quality, comprising:

• an optical pickup head, for emitting a laser beam onto an optical disk;
• a lens, for focusing said laser beam onto said optical disk;
• a controller;
• a program code, being executed by said controller of said optical storage device, such that said optical storage device processes the steps of:
• (A) computing a traveling distance along a focus direction of a lens of an optical storage device, and a first travel time T1 for moving said lens from its lower limit position to its upper limit position;
• (B) driving an optical pickup head to emit a laser beam onto an inner track position of an optical disk and moving said lens from its lower limit position towards its upper limit position and starting to count the time until a focus signal occurs to obtain a second traveling time T2;
• (C) driving said optical pickup head to emit a laser beam onto an outer track position of said optical disk and moving said lens from its lower limit position towards its upper limit position, and starting to compute the time until a focus signal occurs to obtain a third traveling time T3;
• and
• (D) using an assembling quality formula based on said first, second and third traveling time to test the assembling quality of said optical storage device.